Breakthroughs in psychometric models, machine learning technology, and data analytics have made reliable through-course assessment possible, providing an alternative to traditional high-stakes summative testing. The Diagnostic Classification Model (DCM) replaces outdated No Child Left Behind-era, high-stakes assessments based on Classical Test Theory (CTT) and Item Response Theory (IRT). With DCM, educators can utilize highly reliable formative data in real-time to personalize learning and promote student growth.
Join us for a special event where we will explore how this multi-dimensional psychometric model makes assessment data instantly actionable, revolutionizing mastery learning in the classroom. You will hear from the world-renowned psychometrician and the industry leaders who have been pioneering this new approach.
Your no-cost registration includes admission to the event and a networking lunch.
Presentation and Panel Discussion on Innovative Assessment and the Diagnostic Classification Model